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Towards Understanding of Charging Effects of Conductive Thin-Film Based Phase Plates

Published online by Cambridge University Press:  25 July 2016

R. Janzen ,
J. Schundelmeier ,
S. Hettler ,
M. Dries  and
D. Gerthsen
R. Janzen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
J. Schundelmeier
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
S. Hettler
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
M. Dries
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
D. Gerthsen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 78 - 79
Copyright
© Microscopy Society of America 2016 

References

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[2] Malac, M., et al., Ultramicroscopy 118 (2012). p. 77.Google Scholar
[3] Danev, R., et al., PNAS 111 (2014). p. 15635.Google Scholar
[4] Chelluri, B. & Kirchheim, R. J. Non-cryst. Solids 54 (1983). p. 107.Google Scholar
[5] Financial support by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar