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Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm

Published online by Cambridge University Press:  05 August 2019

W. Van den Broek ,
M. Schloz ,
T.C. Pekin ,
P.M. Pelz ,
P.-H. Lu ,
M. Kruth ,
V. Grillo ,
R.E. Dunin-Borkowski ,
R.J.D. Miller  and
C.T. Koch
W. Van den Broek*
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
M. Schloz
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
T.C. Pekin
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
P.M. Pelz
Affiliation:
Max Planck Institute for the Structure and Dynamics of Matter, Center for Free Electron Laser Science, Hamburg, Germany
P.-H. Lu
Affiliation:
Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich, Germany
M. Kruth
Affiliation:
Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich, Germany
V. Grillo
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Modena, Italy
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich, Germany
R.J.D. Miller
Affiliation:
Max Planck Institute for the Structure and Dynamics of Matter, Center for Free Electron Laser Science, Hamburg, Germany Departments of Chemistry and Physics, University of Toronto, Toronto, Canada.
C.T. Koch
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 58 - 59
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Van den Broek, W. and Koch, C.T., Phys. Rev. Lett. 109 (2012) p. 245502.Google Scholar
[2]Van den Broek, W. and Koch, C.T., Phys. Rev. B 87 (2013) p. 184108.Google Scholar
[3]Jiang, X., Van den Broek, W. and Koch, C.T., Optics Express 24 (2016) p. 7006.Google Scholar
[4]Pelz, P.M., et al. , Scientific Reports 7 (2017) p. 9883.Google Scholar
[5]Van den Broek, W., Jiang, X. and Koch, C.T., Ultramicroscopy 158 (2015) p. 89.Google Scholar
[6]Acknowledgments. WVDB: DFG project BR 5095/2-1. PHL and REDB: the German-Israeli Project cooperation grant from the German Research Foundation. VG: support by Q-SORT, funded by the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 766970.Google Scholar