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Towards Li Quantification at High Spatial Resolution Using EDS

Published online by Cambridge University Press:  25 July 2016

P. Hovington ,
V. Timoshevskii ,
S. Burgess ,
P. Statham ,
H. Demers ,
R. Gauvin  and
K. Zaghib
P. Hovington
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada
V. Timoshevskii
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada
S. Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High WycombeUK
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High WycombeUK
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
K. Zaghib
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 84 - 85
Copyright
© Microscopy Society of America 2016 

References

[1] Hovington, P., et al, Scanning 2016, in press.Google Scholar
[2] Terauchi, M., et al, Journal of Electron Microscopy 61(1 (2012). p. 1.Google Scholar