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Towards Automating Structural Discovery in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Nicole Creange
Affiliation:
Oak Ridge National Laboratory, United States
Ondrej Dyck
Affiliation:
Oak Ridge National Laboratory, United States
Christopher Nelson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Rama Vasudevan
Affiliation:
Oak Ridge National Laboratory, United States
Maxim Ziatdinov
Affiliation:
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Sergei Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Pennycook, S. J., Chisholm, M. F., Lupini, A. R., Varela, M., van Benthem, K., Borisevich, A. Y., Oxley, M. P., Luo, W. and Pantelides, S. T., in Advances in Imaging and Electron Physics, Vol 153, edited by Hawkes, P. W. (Elsevier Academic Press Inc, San Diego, 2008), Vol. 153, pp. 327-+.Google Scholar
Pennycook, S. J., Varela, M., Lupini, A. R., Oxley, M. P. and Chisholm, M. F., Journal of Electron Microscopy 58 (3), 87-97 (2009).CrossRefGoogle Scholar
Jiang, Y., Chen, Z., Hang, Y. M., Deb, P., Gao, H., Xie, S. E., Purohit, P., Tate, M. W., Park, J., Gruner, S. M., Elser, V. and Muller, D. A., Nature 559 (7714), 343-+ (2018).CrossRefGoogle Scholar
Lambert, B., A Student's Guide to Bayesian Statistics. (SAGE Publications Ltd; 1 edition, 2018).Google Scholar
Martin, O., Bayesian Analysis with Python: Introduction to statistical modeling and probabilistic programming using PyMC3 and ArviZ, 2nd Edition. (Packt Publishing, 2018).Google Scholar
Kalinin, S. V., Strelcov, E., Belianinov, A., Somnath, S., Vasudevan, R. K., Lingerfelt, E. J., Archibald, R. K., Chen, C. M., Proksch, R., Laanait, N. and Jesse, S., ACS Nano 10 (10), 9068-9086 (2016).CrossRefGoogle Scholar
Zahl, P., Wagner, T., Moller, R. and Klust, A., Journal of Vacuum Science & Technology B 28 (3), C4E39 (2010).CrossRefGoogle Scholar
Krull, A., Hirsch, P., Rother, C., Schiffrin, A. and Krull, C., Commun. Phys. 3 (1), 8 (2020).CrossRefGoogle Scholar
Kalinin, S. V., Borisevich, A. and Jesse, S., Nature 539 (7630), 485-487 (2016).CrossRefGoogle Scholar
Dyck, O., Jesse, S. and Kalinin, S. V., MRS Bull. 44 (9), 669-670 (2019).CrossRefGoogle Scholar