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Towards A More Quantitative Measurement of the Deformation During Metallographic Specimen Preparation Using EBSD and FIB

Published online by Cambridge University Press:  01 August 2010

PT Pinard ,
P Hovington ,
M Lagacé ,
GF Vander Voort  and
R Gauvin
PT Pinard
Affiliation:
McGill University, Canada
P Hovington
Affiliation:
Institut de Recherche d'Hydro-Québec, Canada
M Lagacé
Affiliation:
Institut de Recherche d'Hydro-Québec, Canada
GF Vander Voort
Affiliation:
Struers Inc
R Gauvin
Affiliation:
McGill University, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 700 - 701
Copyright
Copyright © Microscopy Society of America 2010