Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T01:44:48.915Z Has data issue: false hasContentIssue false

Towards 3D lattice reconstruction with the Position Sensitive Atom Probe

Published online by Cambridge University Press:  02 July 2020

PJ. Warren
Affiliation:
Department of Materials, University of Oxford, Parks Road, OxfordOX1 3PH, UK.
A. Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road, OxfordOX1 3PH, UK.
G.D.W. Smith
Affiliation:
Department of Materials, University of Oxford, Parks Road, OxfordOX1 3PH, UK.
Get access

Extract

3-dimensional atom probe (3DAP) analysis enables 3D reconstruction of the chemical variations inside materials with near atomic resolution. This technique has enabled important insights into the phase chemistry and microstructure of a range of complex engineering materials. Although individual planes can be resolved when analysing in a direction close to a low-index pole, the spatial resolution of this technique has not been sufficient for reconstruction of all the original lattice positions. The spatial resolution is thought to be fundamentally limited by small lateral displacements of the atom on the surface of the specimen during the field evaporation process due primarily to interactions with the neighbouring surface atoms. It has therefore been considered that it will be impossible to correctly reconstruct the crystal lattice from 3DAP data. Recently, we have found that a 3DAP reconstruction of a region near a grain boundary in pure tungsten (an element renown for its good imaging and evaporation behaviour) revealed several different sets of crystallographic planes visible at angles up to 45° from the direction of analysis.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Kelly, T.F. et al., Appl. Surf. Sci. 76/77 (1994) xxixxvi.Google Scholar
2.Waugh, A.R. et al., Surf. Sci. 61 (1976) 109.CrossRefGoogle Scholar
3.Warren, P.J. et al., Ultramicroscopy in press.Google Scholar