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Tomography on Point Projection X-Ray Microscope Using CCD Images

Published online by Cambridge University Press:  02 July 2020

Sterling P. Newberry
Sterling P. Newberry*
Affiliation:
CBI LABS, 11 S. Westcott Road, Schenectady, NY12306-9405, USA
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Extract

Recent advances with the cone-beam approach to tomography at the Advanced Microscopy and Imaging Laboratory (AMIL) have opened the possibility of employing tomography with the Shadow Projection X-Ray Microscope routinely when the specimen properties require it. The AMIL approach has been tested on small objects, without magnification, using conventional dental x-ray sources and a modestly diverging beam angle. The shadow projection Microscope, by contrast has a tenfold greater divergence and magnifies the specimen from unity to three or more orders of magnitude in resolution beyond the previous tests. The reader is reminded of the simplicity of the xray projection method and of the clarity of its images in fig. 1 and 2. The microscope can be operated in any laboratory and readily transported to alternate locations. Now that the AMIL data base and algorithms for tomography can be handled by a Pentium II processor the data gathering and reconstructions can also be managed at any laboratory installation.

Type
Advances in Instrumentation
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 352 - 353
Copyright
Copyright © Microscopy Society of America

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References

1.Cheng, P. C.et al., chapter in Modern Microscopies, Duke, P. J., Michette, A. G. Ed. Plenum (1990)Google Scholar
2.Newberry, S. P., in Michette, A. G.et al., Ed. X-Ray Microscopy III, Springer-Verlag (1991)Google Scholar
3. The author wishes to thank E. R. Rivera for Coreyphella and many other disease vector samples.Google Scholar