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TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1026 - 1027
- Copyright
- © Microscopy Society of America 2018
References
[1]
Vanbellingen, Quentin P., et al, Rapid Commun. Mass Spectrom. 29
2015) p. 1187. doi: DOI: 10.1002/rcm.7210.Google Scholar
[2]
Worrich, Anja, et al, Nat. Commun. 8
2017) p. 15472. doi: DOI: 10.1038/NCOMMS1547.Google Scholar
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