Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-17T15:18:24.356Z Has data issue: false hasContentIssue false
  • English
  • Français

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Published online by Cambridge University Press:  01 August 2018

Felix Kollmer ,
Nathan Havercroft ,
Anja Henss ,
Henrik Arlinghaus ,
Wolfgang Paul ,
Rudolf Moellers  and
Ewald Niehuis
Felix Kollmer
Affiliation:
IONTOF GmbH, Muenster, Germany
Nathan Havercroft
Affiliation:
ION-TOF USA, Inc., Chestnut Ridge, NY, USA
Anja Henss
Affiliation:
Physikalisch-Chemisches Institut, Justus-Liebig University Giessen, Germany
Henrik Arlinghaus
Affiliation:
IONTOF GmbH, Muenster, Germany
Wolfgang Paul
Affiliation:
IONTOF GmbH, Muenster, Germany
Rudolf Moellers
Affiliation:
IONTOF GmbH, Muenster, Germany
Ewald Niehuis
Affiliation:
IONTOF GmbH, Muenster, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1026 - 1027
Copyright
© Microscopy Society of America 2018 

References

[1] Vanbellingen, Quentin P., et al, Rapid Commun. Mass Spectrom. 29 2015) p. 1187. doi: DOI: 10.1002/rcm.7210.Google Scholar
[2] Worrich, Anja, et al, Nat. Commun. 8 2017) p. 15472. doi: DOI: 10.1038/NCOMMS1547.Google Scholar