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Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements

Published online by Cambridge University Press:  23 September 2015

William A. Hubbard ,
E. R. White ,
Alexander Kerelsky ,
G. Jasmin ,
Jared J. Lodico ,
Matthew Mecklenburg  and
B. C. Regan
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
E. R. White
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Alexander Kerelsky
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
G. Jasmin
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Jared J. Lodico
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles,CA 90089 USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1911 - 1912
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Valov, I., et al, Nanotechnology 22 (2011). p 289502.Google Scholar
[2] Hubbard, W., et al, Microscopy and Microanalysis 20 (2014). p 1550–1551.Google Scholar
[3] Menzel, S., et al, Physical Chemistry Chemical Physics 20 (2013). p 6945.CrossRefGoogle Scholar
[4] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, and by National Science Foundation award DMR-1206849. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA..Google Scholar