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Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films

Published online by Cambridge University Press:  05 August 2019

Ellis Kennedy*
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA.
Alejandro Ceballos
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Frances Hellman
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. Department of Physics, University of California, Berkeley, Berkeley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Colin Ophus
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Mary Scott
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. The Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, CA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

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[3]Voyles, PM and Muller, DA, Ultramicroscopy 93(2) (2002), p.147.Google Scholar
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[5]This project is supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 within the Non-equilibrium Magnetic Materials Program. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar