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Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films
Published online by Cambridge University Press: 05 August 2019
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[5]This project is supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 within the Non-equilibrium Magnetic Materials Program. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar
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