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Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction

Published online by Cambridge University Press:  25 July 2016

Yifei Meng
Affiliation:
Department of Materials Science & Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
Jian-Min Zuo
Affiliation:
Department of Materials Science & Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Abe, E., et al, Acta Materialia 50 (2002). p. 38453857.CrossRefGoogle Scholar
[2] Wang, D., et al, ACS Nano 3 (2009). p. 907914.CrossRefGoogle Scholar
[3] Koch, C. C., et al, MRS Bulletin 24 (1999). p. 5458.CrossRefGoogle Scholar
[4] Kim, K. H., et al, Micron 71 (2015). p. 3945.CrossRefGoogle Scholar
[5] Mao, S., et al, Acta Materialia 82 (2015). p. 328335.CrossRefGoogle Scholar
[6] Tao, J., et al, Physical Review Letters 103 (2009). p. 097202.CrossRefGoogle Scholar
[7] Liu, H. H., et al, Science 332 (2011). p. 833834.CrossRefGoogle Scholar
[8] We thank Prof. Huang of National Tsinghua University for providing the TiN sample. We thank Dr. Mao and Prof. Dillon of University of Illinois at Urbana-Champaign for providing the design of the tomography holder. This work is supported by U.S. Department of Energy under contract DEFG02-01ER45923.Google Scholar