Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T00:35:06.835Z Has data issue: false hasContentIssue false
  • English
  • Français

Three-Dimensional Microstructural Characterization of Novel Chalcogenide Nanocomposites for Gradient Refractive Index Applications

Published online by Cambridge University Press:  05 August 2019

Hugues Francois-Saint-Cyr ,
Myungkoo Kang ,
Isabelle Martin ,
Stoichko Antonov ,
Ty J. Prosa  and
Kathleen Richardson
Hugues Francois-Saint-Cyr*
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Myungkoo Kang
Affiliation:
CREOL, the College of Optics and Photonics, University of Central Florida, Orlando, FL 32816USA.
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Stoichko Antonov
Affiliation:
University Science and Technology Beijing, 30 Xueyuan Rd, Haidian District, Beijing, 100083China.
Ty J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Kathleen Richardson
Affiliation:
CREOL, the College of Optics and Photonics, University of Central Florida, Orlando, FL 32816USA.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2500 - 2501
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

†

These authors contributed to this work equally.

References

[1]Teichman, J. et al. , Gradient Index Optics at DARPA, The Institute for Defense Analyses (2014).Google Scholar
[2]Sisken, L., PhD Dissertation, University of Central Florida (2017).Google Scholar
[3]Kang, M. et al. , Adv. Mater. 30 (2018), 1803628.Google Scholar
[4]Larson, D. J. et al. , “Local Electrode Atom Probe Tomography”, Springer, New York (2013).Google Scholar
[5]The authors acknowledge the partial support of UCF's Pre-eminent Post-doctoral Scholar Program.Google Scholar