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Three-dimensional imaging of single dopants inside crystals using multislice electron ptychography

Published online by Cambridge University Press:  30 July 2021

Zhen Chen ,
Yu-Tsun Shao ,
Yi Jiang  and
David Muller
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, New York, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL60439, USA, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2146 - 2148
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Chen, Z, et al., arXiv: 2101.00465 (2021).Google Scholar
Jiang, Y, et al. , Nature 559 (2018), p. 343.CrossRefGoogle Scholar
We thank L Caretta, CA Ross and GSD Beach for the garnet sample. Research supported by US NSF (grants DMR-1539918, DMR-1719875).Google Scholar