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Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Published online by Cambridge University Press:  27 August 2014

Jianwei Miao ,
Chien-Chun Chen ,
M. C. Scott ,
Peter Ercius ,
Chun Zhu ,
Matthew Mecklenburg ,
Edward R. White ,
Chin-Yi Chiu ,
B. C. Regan  and
Yu Huang
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Jianwei Miao
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Chien-Chun Chen
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
M. C. Scott
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Chun Zhu
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Matthew Mecklenburg
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Edward R. White
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Chin-Yi Chiu
Affiliation:
Departments of Materials Science & Engineering and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Yu Huang
Affiliation:
Departments of Materials Science & Engineering and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
Laurence D. Marks
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL 60201, USA
Ulrich Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1062 - 1063
Copyright
Copyright © Microscopy Society of America 2014 

References

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[11] This work is partially supported by U. S. Department of Energy, Grant #: DE-FG02-13ER46943.Google Scholar