Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T04:30:28.241Z Has data issue: false hasContentIssue false
  • English
  • Français

Three Dimensional Accurate Morphology Measurements of Polystyrene Standard Particles on Silicon Substrate by Electron Tomography

Published online by Cambridge University Press:  23 September 2015

Misa Hayashida ,
Kazuhiro Kumagai  and
Marek Malac
Misa Hayashida
Affiliation:
National Institute for Nanotechnology (NINT), Edmonton, Alberta, Canada
Kazuhiro Kumagai
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan
Marek Malac
Affiliation:
National Institute for Nanotechnology (NINT), Edmonton, Alberta, Canada Department of Physics, University of Alberta, Edmonton, Alberta, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2405 - 2406
Copyright
Copyright © Microscopy Society of America 2015 

References

Reference:

[1] Misumi, I., et. al., SPIE Proceedings Vol. 8378 (2012) 83780J.CrossRefGoogle Scholar
[2] Hayashida, M., Malac, M., Bergen, M. & Li, P., Ultramicroscopy Vol. 144 (2014) 50–57.Google Scholar
[3] Bergen, M., et. al., Microscopy and Microanalysis 19(S2 (2013) 1394–1395.CrossRefGoogle Scholar