Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T19:54:18.388Z Has data issue: false hasContentIssue false
  • English
  • Français

Thin-Film-Based Phase Plates for Transmission Electron Microscopy Fabricated From Metallic Glasses

Published online by Cambridge University Press:  23 September 2015

M. Dries ,
S. Hettler ,
T. Schulze ,
W. Send ,
E. Miiller ,
R. Schneider ,
D. Gerthsen ,
Y. Luo  and
K. Samwer
M. Dries
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
S. Hettler
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
T. Schulze
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
W. Send
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
E. Miiller
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
R. Schneider
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
D. Gerthsen
Affiliation:
Laboratorium fur Elektronenmikroskopie, Karlsruher Institut fur Technologie, Karlsruhe, Germany
Y. Luo
Affiliation:
I. Physikalisches Institut, Universitat Gottingen, Gottingen, Germany
K. Samwer
Affiliation:
I. Physikalisches Institut, Universitat Gottingen, Gottingen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1575 - 1576
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Danev, R & Nagayama, K, Ultramicroscopy 88 (2001), p 243–252.CrossRefGoogle Scholar
[2] Danev, R, etal, PNAS 111 (2014), p 15635–15640.CrossRefGoogle Scholar
[3] Marko, M, et al, J. Struct. Biol 184 (2013), p 237–244.Google Scholar
[4] Dries, M, et al, Ultramicroscopy 139 (2014), p 29–37.Google Scholar
[5] Rambousky, R, Moske, M & Samwer, K, Z. Phys. B 99 (1996), p 387–391.CrossRefGoogle Scholar
[6] Danev, R & Nagayama, K, J. Phys. Soc. Jpn 73 (2004), p 2718–2724.CrossRefGoogle Scholar
[7] Financial support by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar