Thin Film Quantification by EPMA: Accuracy of Analytical Procedure

C Merlet

doi:10.1017/S1431927606062611

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Thin Film Quantification by EPMA: Accuracy of Analytical Procedure

Published online by Cambridge University Press: 31 July 2006

C Merlet

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C Merlet: Affiliation:
Université de Montpellier II

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 842 - 843

DOI: https://doi.org/10.1017/S1431927606062611 [Opens in a new window]
Copyright: © 2006 Microscopy Society of America

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Thin Film Quantification by EPMA: Accuracy of Analytical Procedure

Volume 12, Issue S02
C Merlet ^(a1)
DOI: https://doi.org/10.1017/S1431927606062611

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Thin Film Quantification by EPMA: Accuracy of Analytical Procedure

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