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Thick (3D) Sample STEM Imaging at Nano Scale: iDPC and ADF Simultaneously

Published online by Cambridge University Press:  01 August 2018

Eric G.T. Bosch
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Ivan Lazic
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Emrah Yucelen
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Piet Trompenaars
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Einspahr, J.J. Voyles, P.M. Ultramicroscopy 106 2006) p. 10411052.Google Scholar
[2] Behan, G., et al, Phil. Trans. R. Soc. A 367 2009) p. 38253844.Google Scholar
[3] Saito, G., et al, Ultramicroscopy 175 2017) p. 97104.Google Scholar
[4] Findlay, S.D., et al, Ultramicroscopy 110 2010) p. 903923.Google Scholar
[5] Bosch, E.G.T. Lazic, I. Ultramicroscopy 156 2015) p. 5972.Google Scholar
[6] Lazic, I. Bosch, E.G.T. Advances in Imaging and Electron Physics 199 2017) p. 75184.Google Scholar
[7] Lazic, I., Bosch, E.G.T. Lazar, S. Ultramicroscopy 160 2016) p. 265280.Google Scholar
[8] Yucelen, E., Lazic, I. Bosch, E.G.T. Scientific Reports 8 2018) p. 2676.Google Scholar