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Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

Published online by Cambridge University Press:  25 July 2016

Szu-Tung Hu ,
K. Hattar  and
Paulo Ferreira
Szu-Tung Hu
Affiliation:
Materials Science and Engineering Program, University of Texas at Austin, Austin TX, USA
K. Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
Paulo Ferreira
Affiliation:
Materials Science and Engineering Program, University of Texas at Austin, Austin TX, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 526 - 527
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Kobler, A., et al, Ultramicroscopy 128 (2013). p. 68.Google Scholar
[2] Rajasekhara, S., et al, Scripta Materialia 67 (2012). p. 189.CrossRefGoogle Scholar
[3] Work was partially by the Division of Materials Science and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar