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Temperature-dependent displacement cross section of graphene and its impurities: measuring the carbon adatom migration barrier

Published online by Cambridge University Press:  30 July 2021

Andreas Postl ,
Jacob Madsen ,
Pit Pascal Patrick Hilgert ,
Makoto Tokoro Schreiber ,
Jani Kotakoski  and
Toma Susi
Andreas Postl
Affiliation:
Faculty of Physics & VDS Physics, University of Vienna, Vienna, Austria, Vienna, Wien, Austria
Jacob Madsen
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria, United States
Pit Pascal Patrick Hilgert
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria, United States
Makoto Tokoro Schreiber
Affiliation:
Okinawa Institute of Science and Technology Graduate University (OIST), Japan, Japan
Jani Kotakoski
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria, Vienna, Wien, Austria
Toma Susi
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria, Vienna, Austria

Abstract

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Type
Exploring Beam-sample Interactions for Uncovering the Atomic or Dynamic Nature of Matter
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3340
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Zan, R. et al. , Nano Letters 12 (2021) 3936–3940.CrossRefGoogle Scholar
Krasheninnikov, A. V. et al. , Physical Review B 69 (2004) 073402.CrossRefGoogle Scholar
Lehtinen, P. O. et al. , Physical Review Letters 91 (2003) 017202.CrossRefGoogle Scholar
Madsen, J. et al. , Microscopy and Microanalysis 25(S2) (2019) 166-167.CrossRefGoogle Scholar
Tripathi, M. et al. , Nano Letters 18 (2018) 5319–5323.CrossRefGoogle Scholar
Su, C. et al. , Science Advances 5 (2019) eaav2252.Google Scholar