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Tem Study of Nano-Crystals in Strontium Ion-Implanted Cubic Zirconia

Published online by Cambridge University Press:  02 July 2020

S. Zhu ,
L.M. Wang ,
S. X. Wang ,
J. Lian  and
R.C. Ewing
S. Zhu
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI48109-2104
L.M. Wang
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI48109-2104
S. X. Wang
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI48109-2104
J. Lian
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI48109-2104
R.C. Ewing
Affiliation:
Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI48109-2104
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Abstract

Yttria stabilized zirconia (YSZ) is an important oxygen ion conducting solid electrolyte. YSZ is used in oxygen sensors, oxygen pumps, and fuel cells. Perovskite-type oxides of general formula ABO3 are also of fundamental significance due to their electrical and electro-optical properties. SrZrO3 is a promising material- for application as protonic conductor. in this paper, we present electron microscopy analysis of the formation of SrZrO3 nano-particles in the top surface of YSZ single crystal after ion implantation. These results demonstrate a unique process for obtaining mixed-conducting oxides in the surface layer of YSZ. in addition, it is important to study the behavior of strontium in YSZ because of the potential application of YSZ as an inert fuel matrix for “burning“ excess plutonium in nuclear reactors.

400 keV strontium ions have been implanted into YSZ at room temperature to a fluence of lxl021 ions/m2.

Type
Novel Microscopy Assisted Ceramic Developments in Materials Scienceand Nanotechnology (Organized by P. Gai and J. Lee)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 406 - 407
Copyright
Copyright © Microscopy Society of America 2001

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References

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5. This work is supported by U.S. Department of Energy under grant DE-FG07-99ID13767.Google Scholar