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TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique

Published online by Cambridge University Press:  01 August 2004

Dorothy W. Coffey
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Karren L. More
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Tracie Brummett
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

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