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TEM Measurements of Grain Orientation in Nanoscale Cu Interconnects using ACT Software

Published online by Cambridge University Press:  05 August 2007

JH An  and
PJ Ferreira
JH An
Affiliation:
University of Texas at Austin
PJ Ferreira
Affiliation:
University of Texas at Austin
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 538 - 539
Copyright
© 2007 Microscopy Society of America

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