Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T12:19:53.756Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM Characterization of Thin, Epitactic Ni2MnGa films on GaAs.

Published online by Cambridge University Press:  01 November 2002

S. McKernan ,
J. W. Dong  and
C. J. Palmstrøm
S. McKernan
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455
J. W. Dong
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455
C. J. Palmstrøm
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 302 - 303
Copyright
Copyright © Microscopy Society of America 2002