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TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars

Published online by Cambridge University Press:  26 July 2009

N Mara ,
D Bhattacharyya ,
P Dickerson ,
R Hoagland  and
A Misra
N Mara
Affiliation:
Los Alamos National Laboratory
D Bhattacharyya
Affiliation:
Los Alamos National Laboratory
P Dickerson
Affiliation:
Los Alamos National Laboratory
R Hoagland
Affiliation:
Los Alamos National Laboratory
A Misra
Affiliation:
Los Alamos National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 352 - 353
Copyright
Copyright © Microscopy Society of America 2009