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TEM Characterization of Ball Milled CIS and CIGS Nanoparticles

Published online by Cambridge University Press:  23 September 2015

I. I. Santana-Garcia ,
C. Kisielowski  and
H. A. Calderon
I. I. Santana-Garcia
Affiliation:
Departamento de Fisica, ESFM-IPN, Mexico D.F. 07338, Mexico
C. Kisielowski
Affiliation:
Molecular Foundry and JCAP, LBNL, One Cyclotron Road, Berkeley, CA 94720, USA
H. A. Calderon
Affiliation:
Departamento de Fisica, ESFM-IPN, Mexico D.F. 07338, Mexico

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2085 - 2086
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Calderon, H.A., Kisielowski, C., Specht, P., Barton, B., Godinez-Salomon, F. & Solorza-Feria, O., Micron 68 (2014). p. 164.CrossRefGoogle Scholar
[2] Electron Microscopy was performed at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No.DE-AC02-05CH11231. The research is partially supported by CONACYT (Proyecto FOINST. 75/2012, 148304 and 129207), IPN (COFAA, SIP).Google Scholar