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TEM Analysis of Pulse Laser Deposited BaFe12O19 Films on SiC

Published online by Cambridge University Press:  01 August 2010

VK Lazarov ,
Z Cai ,
K Yoshida ,
P Hasnip  and
KS Ziemer
VK Lazarov
Affiliation:
University of York, United Kingdom
Z Cai
Affiliation:
Northeastern University
K Yoshida
Affiliation:
York JEOL Nanoscience Center, United Kingdom
P Hasnip
Affiliation:
University of York, United Kingdom
KS Ziemer
Affiliation:
Northeastern University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1232 - 1233
Copyright
Copyright © Microscopy Society of America 2010