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Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis

Published online by Cambridge University Press:  30 July 2021

Tristan O'Neill ,
B. C. Regan  and
Matthew Mecklenburg
Tristan O'Neill
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
B. C. Regan
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States, United States
Matthew Mecklenburg
Affiliation:
The Aerospace Corporation, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1540 - 1541
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Gaulandris, F., et al. , Microscopy and Microanalysis, 26(1) (2020), p. 3-17.CrossRefGoogle Scholar
Ophus, C., Microscopy and Microanalysis, 25(3) (2019), p. 563-582.CrossRefGoogle Scholar
Thomas, I. and Schmid, M., Microscopy and Microanalysis, 1(4) (1995), p. 167-173CrossRefGoogle Scholar
The data was acquired at the Core Center of Excellence in Nano Imaging (CNI), University of Southern California. This work was supported by National Science Foundation (NSF) Science and Technology Center (STC) award DMR-1548924 (STROBE) and by NSF award DMR-2004897.Google Scholar