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Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls

Published online by Cambridge University Press:  22 July 2022

Aleksander B. Mosberg ,
Iain Godfrey  and
Quentin Ramasse
Aleksander B. Mosberg*
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Iain Godfrey
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom Schools of Chemical and Process Engineering & Physics and Astronomy, University of Leeds, Leeds, United Kingdom
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 20 - 21
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Copyright
Copyright © Microscopy Society of America 2022

References

Melngailis, J, J. Vac. Sci. Technol. B., 5(2) (1987), p. 469. doi: 10.1116/1.583937CrossRefGoogle Scholar
Schaffer, M et al. , Ultramicroscopy 107(8) (2007), p. 587-597. doi: 10.1016/j.ultramic.2006.11.007CrossRefGoogle Scholar
Skoric, L et al. , Nano Letters 20 (1) (2020), p. 184-191. doi: 10.1021/acs.nanolett.9b03565CrossRefGoogle Scholar
Deinhart, V et al. , Beilstein J. Nanotechnol. 12 (2021), p. 304-318. doi: 10.3762/bjnano.12.25CrossRefGoogle Scholar
Klumpe, S et al. , eLife 10 (2021). doi: 10.7554/eLife.70506CrossRefGoogle Scholar
The authors would like to thank Michael Dixon and Hitachi High-Technologies Europe for useful discussions and technical input. SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar