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Synchrotron X-ray Micro Tomography at the Advanced Light Source: In-Situ Sample Environments for Advanced Aerospace Materials

Published online by Cambridge University Press:  10 August 2018

Harold S. Barnard ,
A.A Macdowell ,
D.Y. Parkinson ,
N.M. Larson ,
J.C. Peterson ,
F. Panerai ,
N.N. Mansour  and
Y. Gao
Harold S. Barnard*
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA, USA.
A.A Macdowell
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA, USA.
D.Y. Parkinson
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA, USA.
N.M. Larson
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA, USA. University of California, Santa Barbara, Dept. of Materials Science, Santa Barbara CA, USA.
J.C. Peterson
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA, USA.
F. Panerai
Affiliation:
NASA Ames Research Center, Moffett Field CA, USA.
N.N. Mansour
Affiliation:
NASA Ames Research Center, Moffett Field CA, USA.
Y. Gao
Affiliation:
GE Global Research, Niskayuna NY, USA
*
*Corresponding author, [email protected]

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 444 - 445
Copyright
© Microscopy Society of America 2018 

References

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