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Surface Topotactic Growth of Edge-Terminated MoS2 Catalysts

Published online by Cambridge University Press:  05 August 2019

Christian Dahl-Petersen
Affiliation:
Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark. Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, Denmark.
Manuel Saric
Affiliation:
Nano-Science Center, Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100 Copenhagen, Denmark.
Michael Brorson
Affiliation:
Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark.
Lars P. Hansen
Affiliation:
Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark.
Poul Georg Moses
Affiliation:
Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark.
Jan Rossmeissl
Affiliation:
Nano-Science Center, Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100 Copenhagen, Denmark.
Jeppe V. Lauritsen
Affiliation:
Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, Denmark.
Stig Helveg*
Affiliation:
Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bodin, A., Christoffersen, A.-L. N., Elkjær, C. F., Brorson, M., Kibsgaard, J., Helveg, S., Chorkendorff, I., Nano Letters 18 (2018), p. 3454.Google Scholar
[2]Wang, Z., Li, Q., Xu, H., Dahl-Petersen, C., Yang, Q., Cheng, D., Cao, D., Besenbacher, F., Lauritsen, J.V., Helveg, S., Dong, M., Nano Energy 49 (2018), p. 634Google Scholar
[3]Kisielowski, C., Ramasse, Q. M., Hansen, L. P., Brorson, M., Carlsson, A., Molenbroek, A. M., Topsøe, H., Helveg, S., Angew. Chemie Int. Ed. 49 (2010), p. 2708.Google Scholar
[4]Hansen, L.P., Ramasse, Q. M., Kisielowski, C., Brorson, M., Johnson, E., Topsøe, H., Helveg, S., Angew. Chemie Int. Ed. 50 (2011), p. 10153.Google Scholar
[5]Zhu, Y., Ramasse, Q. M., Brorson, M., Moses, P. G., Hansen, L. P., Kisielowski, C. F., Helveg, S., Angew. Chemie Int. Ed. 53 (2014), 10723.Google Scholar
[6]Helveg, S., J. Catal. 328 (2015), p. 102.Google Scholar
[7]Hansen, L.P., Johnson, E., Brorson, M., Helveg, S., J. Phys. Chem. C. 118 (2014), p. 22768.Google Scholar
[8]Cavalca, F., Beato, P., Hyldtoft, J., Christensen, K., Helveg, S., J. Phys. Chem. C 121 (2017), p. 3350.Google Scholar
[9]Dahl-Petersen, C., Saric, M., Brorson, M., Moses, P.G., Rossmeisl, J., Lauritsen, J.V., Helveg, S., ACS Nano 12 (2018), p. 5351.Google Scholar
[10]Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., Yuan, G. and Frei, H., Micron 68 (2015), p. 176.Google Scholar
[11]The experimental work was performed at the electron microscopy facility at Haldor Topsoe A/S. The authors acknowledge funding from the Innovation Fund Denmark (Grants Cat-C and HYDECAT).Google Scholar