Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T07:39:27.743Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface- and Microanalysis by Low Energy Ion Scattering

Published online by Cambridge University Press:  01 August 2010

T Grehl ,
E Niehuis  and
HH Brongersma
T Grehl
Affiliation:
ION-TOF GmbH, Germany
E Niehuis
Affiliation:
ION-TOF GmbH, Germany
HH Brongersma
Affiliation:
ION-TOF GmbH, Germany

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 370 - 371
Copyright
Copyright © Microscopy Society of America 2010