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Support Vector Machines for Classification and Quantitative Analysis

Published online by Cambridge University Press:  27 August 2014

Jeffrey M. Davis
Jeffrey M. Davis*
Affiliation:
National Institute of Standards and Technology, 100 Bureau Drive, MS 8371, Gaithersburg, MD

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 656 - 657
Copyright
Copyright © Microscopy Society of America 2014 

References

(1) Cortes, C., Vapnik, V. “Support-vector Networks” Machine Learning 20, 273-297 (1995.Google Scholar
(2) De Vries, J., Vrebos, B. “XRF Quantification of Infinitely Thick Samples.” Handbook of X-ray Spectrometry (1993.Google Scholar