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Super-Resolution Fluorescence in Electron Micrographs Using In-Situ Integrated Microscopy

Published online by Cambridge University Press:  21 December 2016

Jacob P. Hoogenboom
Jacob P. Hoogenboom*
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S5: Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , November 2016 , pp. 42 - 43
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] de Boer, P, Hoogenboom, JP & Giepmans, BNG Nature Methods 12 (2015). p 503.CrossRefGoogle Scholar
[3] Zonnevylle, AC, et al, Journal of Microscopy 252 (2013). p 58.CrossRefGoogle Scholar
[4] Liv, N, et al, ACS Nano 10 (2016). p 265.Google Scholar