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Sub-surface Serial Block Face Scanning Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Q. He ,
M.A. Aronova ,
D.C. Joy ,
G. Zhang  and
R.D. Leapman
Q. He
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD 20892
M.A. Aronova
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD 20892
D.C. Joy
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831
G. Zhang
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD 20892
R.D. Leapman
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD 20892

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1267 - 1268
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Hennig, P & Denk, W, Journal of Applied Physics 102 (2007). p 123101–123111.Google Scholar
[2] Boughorbel, F, et al, FEI Compnay, US Patent (#US8,232,523 B2) 2011.Google Scholar
[3] Demers, H, et al, Scanning 33 (2011). p 135.Google Scholar
[4] This research was supported by the intramural program of the National Institute of Biomedical Imaging and Bioengineering, NIH.Google Scholar