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Subsurface Particle Analysis using X-ray Computed Tomography and Confocal Xray Fluorescence

Published online by Cambridge University Press:  27 August 2014

Nikolaus L. Cordes ,
Srivatsan Seshadri ,
George J. Havrilla ,
Brian M. Patterson ,
Michael Feser ,
Xiaoli Yuan ,
Ying Gu  and
Deming Wang
Nikolaus L. Cordes
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, USA
Srivatsan Seshadri
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
George J. Havrilla
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, USA
Brian M. Patterson
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, USA
Michael Feser
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
Xiaoli Yuan
Affiliation:
Julius Kruttschnitt Mineral Research Center, University of Queensland, Indooroopilly, Brisbane, Australia
Ying Gu
Affiliation:
Julius Kruttschnitt Mineral Research Center, University of Queensland, Indooroopilly, Brisbane, Australia
Deming Wang
Affiliation:
Julius Kruttschnitt Mineral Research Center, University of Queensland, Indooroopilly, Brisbane, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 778 - 779
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Patterson, B. M., Campbell, J., Havrilla, G. J X-Ray Spectrometry, 39 (2010), p. 184.Google Scholar
[2] This work was partially funded by National Science Foundation, under the award number NSF IIP-1248744.Google Scholar