Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-22T23:54:37.232Z Has data issue: false hasContentIssue false
  • English
  • Français

Substrate Surface Roughness-Induced Antiphase Boundaries and Strain Relaxation in Cufe2o4 Films on Mgal2o4 (001) Substrates

Published online by Cambridge University Press:  01 August 2018

Kun Liu ,
Ruyi Zhang ,
Shao-Bo Mi ,
Lu Lu ,
Ming Liu ,
Hong Wang  and
Chun-Lin Jia
Kun Liu
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Ruyi Zhang
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Shao-Bo Mi
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Lu Lu
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Ming Liu
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Hong Wang
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China
Chun-Lin Jia
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an, PR China Peter Griinberg Institute and Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Forschungszentrum Julich, Julich, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 162 - 163
Copyright
© Microscopy Society of America 2018 

References

[1] Luders, U., et al, Appl. Phys. Lett. 88 2006) p. 082505.Google Scholar
[2] Yang, A., et al, J. Appl. Phys. 97 2005) p. 10G107.Google Scholar
[3] Jiang, J. C., et al, J. Appl. Phys. 91 2002) p. 3188.Google Scholar
[4] Du, H. C., et al, Acta Mater. 89 2015) p. 344.Google Scholar
[5] The work was supported by the National Natural Science Foundation of China (Nos. 51471169 and 51390472) and the National Basic Research Program of China (No. 2015CB654903).Google Scholar