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Study on the Atomic and Electronic Structure in CrN (VN, TiN) Films using CS-Corrected TEM

Published online by Cambridge University Press:  23 September 2015

Zaoli Zhang  and
Gerhard Dehm
Zaoli Zhang*
Affiliation:
Erich Schmid Institute, Austrian Academy of Sciences, Leoben, Austria
Gerhard Dehm
Affiliation:
Max-Planck-Institut fur Eisenforschung, Dusseldorf, Germany
*
*Email: [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2079 - 2080
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Zhang, Z. L., et al, Journal of Applied Physics 110 (2011). p 043524–4.Google Scholar
[4] Zhang, Z.L., et al, Physical Review B 87 (2013). p 014104.Google Scholar
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[7] Acknowledgement: Gabriele Moser and Herwig Felber are gratefully acknowledged for their help with sample preparation, thanks are given to Dr.Hong Li for ab-initio calculations. Thank Dr. Rostislav Daniel and Christian Mitterer in Montanuniversitat Leoben, Leoben, Austria for delivering the materials..Google Scholar