Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Rios, Steven E.
Bandyopadhyay, Anup K.
Smith, Casey
and
Gutierrez, Carlos J.
2005.
The enhancement of magnetically ordered oxide layered structures using oxygen radical processing.
Journal of Magnetism and Magnetic Materials,
Vol. 286,
Issue. ,
p.
455.
Morgan, Christopher G
Gleason, Mark M
and
Vane, Ronald
2007.
Quantification of Contaminant Removal by Evactron Cleaning Using Quartz Crystal Thickness Monitors.
Microscopy Today,
Vol. 15,
Issue. 5,
p.
22.
Larionov, Yu. V.
Mityukhlyaev, V. B.
and
Filippov, M. N.
2008.
Effect of sample contamination in SEMs on linear size measurements.
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques,
Vol. 2,
Issue. 5,
p.
727.
Horiuchi, Shin
Hanada, Takeshi
Ebisawa, Masaharu
Matsuda, Yasuhiro
Kobayashi, Motoyasu
and
Takahara, Atsushi
2009.
Contamination-Free Transmission Electron Microscopy for High-Resolution Carbon Elemental Mapping of Polymers.
ACS Nano,
Vol. 3,
Issue. 5,
p.
1297.
Wanzenboeck, H. D.
Roediger, P.
Hochleitner, G.
Bertagnolli, E.
and
Buehler, W.
2010.
Novel method for cleaning a vacuum chamber from hydrocarbon contamination.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 28,
Issue. 6,
p.
1413.
Alshwawreh, N.
Militzer, M.
Bizzotto, D.
and
Kuo, J.C.
2012.
Resistivity-microstructure correlation of self-annealed electrodeposited copper thin films.
Microelectronic Engineering,
Vol. 95,
Issue. ,
p.
26.
Leng, Haixu
Szychowski, Brian
Daniel, Marie-Christine
and
Pelton, Matthew
2017.
Dramatic Modification of Coupled-Plasmon Resonances Following Exposure to Electron Beams.
The Journal of Physical Chemistry Letters,
Vol. 8,
Issue. 15,
p.
3607.
Gao, Xin
Huang, Tao
Tang, Ping
Di, Jianglei
Zhong, Liyun
and
Zhang, Weina
2024.
Enhancing scanning electron microscopy imaging quality of weakly conductive samples through unsupervised learning.
Scientific Reports,
Vol. 14,
Issue. 1,