Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T02:36:13.979Z Has data issue: false hasContentIssue false
  • English
  • Français

Study by SEM of Carbon Nanotubes Deposited by CVD Using Al2O3 and TiO2 as Catalysts

Published online by Cambridge University Press:  05 August 2019

L. Béjar ,
E. Huape ,
A. Medina ,
Abraham A. Mejía ,
C. Aguilar ,
C. Parra  and
I. Alfonso
L. Béjar
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
E. Huape
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
A. Medina
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
Abraham A. Mejía*
Affiliation:
Alumno Doctorado Posgrado de la Facultad de Ingeniería Mecánica/Universidad Michoacana de San Nicolás de Hidalgo, Ciudad Universitaria, C.P. 58000, Michoacán, México.
C. Aguilar
Affiliation:
Departamento de Ingeniería Metalúrgica y Materiales/Universidad Técnica Federico Santa María, Av. España 1680, Valparaíso, Chile.
C. Parra
Affiliation:
Departamento de Física/Universidad Técnica Federico Santa María, Av. España 1680, Valparaíso, Chile.
I. Alfonso
Affiliation:
Instituto de Investigaciones en Materiales, Departamento de Materiales/UNAM Campus Morelia, Antigua carretera a Pátzcuaro 8701, Morelia, Mich., México. 58190.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2384 - 2385
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Sierra, Germán A. and Torres, Diana M., Ing. y Compet., vol. 14, no.2 (2012) p. 136-142.Google Scholar
[2]Mejía, A. A., Béjar, L., Parra, C., Aguilar, C., Medina, A., Huape Padilla, E., Borjas-García, S. E and Bernal, J. L. Microscopy & Microanalysis., vol. 24 no.S1 (2018), p. 1094-1095.Google Scholar
[3]Béjar, L., Mejía, Abraham A., Parra, C., Aguilar, C., Medina, A., Borjas-García, S E. and Bernal, J. L., Microscopy & Microanalysis., vol. 24 no. S1 (2018), p. 1092-1093.Google Scholar