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Structure and Phase Stability in Extreme Environments Explored via In-situ TEM Experiments

Published online by Cambridge University Press:  22 July 2022

Eric Lang ,
Nathan Madden ,
Ryan Schoell ,
Trevor Clark ,
David P. Adams  and
Khalid Hattar
Eric Lang
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
Nathan Madden
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
Ryan Schoell
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
Trevor Clark
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
David P. Adams
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
Khalid Hattar*
Affiliation:
Sandia National Laboratories, Albuquerque, NM USA
*
Corresponding Author email: [email protected]

Abstract

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Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1848 - 1850
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Copyright
Copyright © Microscopy Society of America 2022

References

Taheri, ML et al. , Ultramicroscopy 170 (2016), p. 86.10.1016/j.ultramic.2016.08.007CrossRefGoogle Scholar
Hattar, K et al. , Nuclear Instruments & Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 338 (2014), p. 56.10.1016/j.nimb.2014.08.002CrossRefGoogle Scholar
Guo, P et al. , Applied sciences 9(3) (2019), p. 530.10.3390/app9030530CrossRefGoogle Scholar
Clark, T et al. , Microscopy and Microanalysis 27(S1) (2021), p. 1232-.10.1017/S1431927621004621CrossRefGoogle Scholar
This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government.Google Scholar