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Structural, Optical and Thermal Behavior investigation of 2D Bi2Te3/Sb2Te3 in-plane Heterostructures via Aberration Corrected STEM and EELS

Published online by Cambridge University Press:  05 August 2019

Parivash Moradifar
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA
Saiphaneendra Bachu
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA
Tiva Sharifi
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX 77005, USA Department of Physics, Umeå University, Umeå 90187, Sweden
Pulickel Ajayan
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX 77005, USA
Nasim Alem
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hussain, N, Zhang, Q, Lang, J, Zhang, R, Muhammad, M, Huang, K, Villenoisy, TCD, Ya, H, Karim, A, Wu, H, Adv.Optical Mater., 6(2018), P.1701322Google Scholar
[2]Sharifi, T, Yazdi, S, Costin, G, Apte, A, Coulter, G, Tiwary, C, Ajayan, PM, Chem. Mater. 30 (2018), P.6108Google Scholar
[3]Zhao, M, Bosman, M, Danesh, M, Zeng, M, Song, P, Darma, Y, Rusydi, A, Lin, H, Qiu, CW, Loh, KP, Nano Lett., 15(2015), P.8331Google Scholar
[4]Cha, JJ, Koski, KJ, Huang, KCY, Wang, KX, Luo, W, Kong, D, Yu, Z, Fan, S, Brongersma, ML, Cui, Y, Nano Lett., 13 (2013), P.5913Google Scholar
[5]Park, HJ, Ryu, GH, Lee, Z, Appl Microsc, 45 (2015), P. 107Google Scholar