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Structural and Compositional Properties of Recrystallized CdS/CdTe Thin-Films Grown on Oxidized Silicon Substrates

Published online by Cambridge University Press:  05 August 2019

David Magginetti
Affiliation:
Materials Science and Engineering, University of Utah, Salt Lake City, UT 84102, USA
Jeffery Aguiar
Affiliation:
Materials Science and Engineering, University of Utah, Salt Lake City, UT 84102, USA Nuclear Materials Department, Idaho National Laboratory, Idaho Falls, ID 83415, USA
Heayoung Yoon*
Affiliation:
Materials Science and Engineering, University of Utah, Salt Lake City, UT 84102, USA Electrical and Computer Engineering, University of Utah, Salt Lake City, UT 84102, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]The authors acknowledge fundings from the University of Utah Seed Grant, NSF No. 1711885, NSF DMR No. 1121252, and DOE DE-AC07-05ID14517.Google Scholar