Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-19T14:34:52.565Z Has data issue: false hasContentIssue false
  • English
  • Français

Stroboscopic High-Duty-Cycle GHz Time-Resolved Microscope: First Proof of a Picosecond Beam Operated at GHz Level on a 200 keV Beamline

Published online by Cambridge University Press:  01 August 2018

Ao Liu ,
Chunguang Jing ,
Alexei Kanareykin ,
Yubin Zhao ,
Bryan Reed ,
Daniel Masiel ,
Yimei Zhu  and
June W. Lau
Ao Liu
Affiliation:
Euclid TechLabs, Bolingbrook, USA
Chunguang Jing
Affiliation:
Euclid TechLabs, Bolingbrook, USA
Alexei Kanareykin
Affiliation:
Euclid TechLabs, Bolingbrook, USA
Yubin Zhao
Affiliation:
Euclid TechLabs, Bolingbrook, USA
Bryan Reed
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, USA
Daniel Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, USA
Yimei Zhu
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, USA
June W. Lau
Affiliation:
Materials Science and Engineering Division, National Institute of Standards and Technology,Gaithersburg, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1964 - 1965
Copyright
© Microscopy Society of America 2018 

References

[1] Qiu, J, et al, Ultramicroscopy 161 2016) p. 130.Google Scholar
[2] Certain commercial equipment, instruments, or materials are identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
[3] We are grateful for the crucial advice and assistance from Hideaki Arima, Bob Pohorenec, JohnGuerin, and many others at (JEOL USA). This work was supported by DOE BES SBIR program Grantno. DE-SC0013121, andNIST award SB1341-16-CN-0035.Google Scholar