Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-27T11:26:38.039Z Has data issue: false hasContentIssue false

Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices

Published online by Cambridge University Press:  30 July 2021

Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Xiurong Zhu
Affiliation:
Emabsoftware Inc, Champaign, Illinois, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Rauch, E.F., Duft, A., Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera, Materials Science Forum, 495-497 (2005) 197-202.CrossRefGoogle Scholar
Meng, Y., Zuo, J.-M., Improvements in electron diffraction pattern automatic indexing algorithms, Eur. Phys. J. Appl. Phys., 80 (2017) 10701.CrossRefGoogle Scholar
Midgley, P.A., Eggeman, A.S., Precession electron diffraction - a topical review, Iucrj, 2 (2015) 126-136.CrossRefGoogle ScholarPubMed
Zuo, J.M., Zhu, X.R., Ang, E., Shah, R., cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations, Microscopy Today, 29 (2021) 24-27.CrossRefGoogle Scholar
Zuo, J.-M., Electron nanodiffraction, in: Hawkes, P.W., Spence, J.C.H. (Eds.) Springer Handbook of Microscopy, Springer International Publishing, Cham, 2019.Google Scholar