Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-27T00:33:28.471Z Has data issue: false hasContentIssue false
  • English
  • Français

Strained BaTiO3 / SrTiO3 Superlattice Grwon by Reactive Molecular Beam Epitaxy

Published online by Cambridge University Press:  02 July 2020

W. Tian ,
J. C. Jiang ,
J. H. Haeni ,
D. G. Schlom  and
X. Q. Pan
W. Tian
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI-48109
J. C. Jiang
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI-48109
J. H. Haeni
Affiliation:
Dept. of Materials Science and Engineering, Perm State University, University Park, PA-16802
D. G. Schlom
Affiliation:
Dept. of Materials Science and Engineering, Perm State University, University Park, PA-16802
X. Q. Pan
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI-48109
Get access

Extract

Due to their unique dielectric and ferroelectric properties, ferroelectric superlattices have attracted increasing interest for fundamental and applied research. Such superlattices with a small layer thickness (a few unit cells) provide a model system to investigate the effects of crystal size, internal strain, interfacial structure and chemistry on physical properties. Recent development in oxide thin film epitaxial growth using reactive molecular beam epitaxy (MBE) make it possible to grow high quality metastable oxide superlattice films. BaTiO3 / SrTiO3 system has been selected for this study.

[(BaTiO3)5 / (SrTiO3)5]20 superlattice films were grown on (001) SrTiO3 substrates by reactive MBE. The atomic structure of these films and the related heterostructural interfaces have been investigated by a combination of high-resolution transmission electron microscopy (HRTEM) and computer image simulations. HRTEM studies were conducted within JEOL-4000EX electron microscope equipped with Gatan Image Filter (GIF), which is operated at 400 kV.

Type
Ceramics & Minerals
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 400 - 401
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Kanno, I., Hayashi, S., Takayama, R., and Hirao, T., Appl. Phys. Lett. 68 (1996) 328.CrossRefGoogle Scholar
2.Qu, B. D., Evstigneev, M., Johnson, D. J., and Price, R. H., Appl. Lett. Phys. 72 (1998) 1394.CrossRefGoogle Scholar