Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Müller, Knut
Ryll, Henning
Ordavo, Ivan
Ihle, Sebastian
Strüder, Lothar
Volz, Kerstin
Zweck, Josef
Soltau, Heike
and
Rosenauer, Andreas
2012.
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device.
Applied Physics Letters,
Vol. 101,
Issue. 21,
p.
212110.
Müller, K
Ryll, H
Ordavo, I
Schowalter, M
Zweck, J
Soltau, H
Ihle, S
Strüder, L
Volz, K
Potapov, P
and
Rosenauer, A
2013.
STEM strain analysis at sub-nanometre scale using millisecond frames from a direct electron read-out CCD camera.
Journal of Physics: Conference Series,
Vol. 471,
Issue. ,
p.
012024.
Persson, J. M.
and
Wagner, J. B.
2013.
Mapping the Local Structure of Nanowires.
Practical Metallography,
Vol. 50,
Issue. 6,
p.
391.
Tewes, M
Krause, F F
Müller, K
Potapov, P
Schowalter, M
Mehrtens, T
and
Rosenauer, A
2013.
Quantitative Composition Evaluation from HAADF-STEM in GeSi/Si Heterostructures.
Journal of Physics: Conference Series,
Vol. 471,
Issue. ,
p.
012011.
Rouviere, Jean-Luc
Béché, Armand
Martin, Yannick
Denneulin, Thibaud
and
Cooper, David
2013.
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction.
Applied Physics Letters,
Vol. 103,
Issue. 24,
Hÿtch, Martin J.
and
Minor, Andrew M.
2014.
Observing and measuring strain in nanostructures and devices with transmission electron microscopy.
MRS Bulletin,
Vol. 39,
Issue. 2,
p.
138.
Vigouroux, M. P.
Delaye, V.
Bernier, N.
Cipro, R.
Lafond, D.
Audoit, G.
Baron, T.
Rouvière, J. L.
Martin, M.
Chenevier, B.
and
Bertin, F.
2014.
Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera.
Applied Physics Letters,
Vol. 105,
Issue. 19,
Ozdol, V. B.
Gammer, C.
Jin, X. G.
Ercius, P.
Ophus, C.
Ciston, J.
and
Minor, A. M.
2015.
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction.
Applied Physics Letters,
Vol. 106,
Issue. 25,
Müller-Caspary, Knut
Oelsner, Andreas
and
Potapov, Pavel
2015.
Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector.
Applied Physics Letters,
Vol. 107,
Issue. 7,
Gammer, Christoph
Burak Ozdol, V.
Liebscher, Christian H.
and
Minor, Andrew M.
2015.
Diffraction contrast imaging using virtual apertures.
Ultramicroscopy,
Vol. 155,
Issue. ,
p.
1.
Mahr, Christoph
Müller-Caspary, Knut
Grieb, Tim
Schowalter, Marco
Mehrtens, Thorsten
Krause, Florian F.
Zillmann, Dennis
and
Rosenauer, Andreas
2015.
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.
Ultramicroscopy,
Vol. 158,
Issue. ,
p.
38.
Grieb, Tim
Krause, Florian Fritz
Mahr, Christoph
Müller‐Caspary, Knut
Zillmann, Dennis
Schowalter, Marco
and
Rosenauer, Andreas
2016.
European Microscopy Congress 2016: Proceedings.
p.
621.
Schmidt, Th.
Speckmann, M.
Flege, J. I.
Müller-Caspary, K.
Heidmann, I.
Kubelka-Lange, A.
Menteş, T. O.
Niño, M. Á.
Locatelli, A.
Rosenauer, A.
and
Falta, J.
2016.
Mazes and meso-islands: Impact of Ag preadsorption on Ge growth on Si(111).
Physical Review B,
Vol. 94,
Issue. 23,
Carvalho, Daniel
Müller-Caspary, Knut
Schowalter, Marco
Grieb, Tim
Mehrtens, Thorsten
Rosenauer, Andreas
Ben, Teresa
García, Rafael
Redondo-Cubero, Andrés
Lorenz, Katharina
Daudin, Bruno
and
Morales, Francisco M.
2016.
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction.
Scientific Reports,
Vol. 6,
Issue. 1,
Müller-Caspary, Knut
Oelsner, Andreas
and
Potapov, Pavel
2016.
STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector.
Microscopy and Microanalysis,
Vol. 22,
Issue. S3,
p.
520.
Gammer, C.
Kacher, J.
Czarnik, C.
Warren, O. L.
Ciston, J.
and
Minor, A. M.
2016.
Local and transient nanoscale strain mapping during in situ deformation.
Applied Physics Letters,
Vol. 109,
Issue. 8,
Mahr, Christoph
Müller‐Caspary, Knut
Grieb, Tim
Krause, Florian F.
Schowalter, Marco
Lackmann, Anastasia
Wittstock, Arne
and
Rosenauer, Andreas
2016.
European Microscopy Congress 2016: Proceedings.
p.
651.
Zweck, Josef
Schwarzhuber, Felix
Wild, Johannes
and
Galioit, Vincent
2016.
On detector linearity and precision of beam shift detection for quantitative differential phase contrast applications.
Ultramicroscopy,
Vol. 168,
Issue. ,
p.
53.
Müller‐Caspary, Knut
Oelsner, Andreas
Potapov, Pavel
and
Schmidt, Thomas
2016.
European Microscopy Congress 2016: Proceedings.
p.
556.
Cooper, David
Denneulin, Thibaud
Bernier, Nicolas
Béché, Armand
and
Rouvière, Jean-Luc
2016.
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope.
Micron,
Vol. 80,
Issue. ,
p.
145.