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Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography

Published online by Cambridge University Press:  08 April 2017

J Rouvière ,
A Béché ,
T Denneulin  and
D Cooper
J Rouvière
Affiliation:
CEA Grenoble, France
A Béché
Affiliation:
FEI Company, The Netherlands
T Denneulin
Affiliation:
CEA Grenoble, France
D Cooper
Affiliation:
CEA Grenoble, France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1068 - 1069
Copyright
Copyright © Microscopy Society of America 2011