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Strain Distribution Analysis during Tensile Deformation of Silicon Nanowire with 4D-STEM

Published online by Cambridge University Press:  22 July 2022

Sihan Wang ,
Hongyu Wang ,
Xiaotian Fang ,
Yong Zhu  and
Wenpei Gao
Sihan Wang
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States
Hongyu Wang
Affiliation:
Department of Mechanical and Aerospace Engineering, North Carolina State University, Raleigh, NC, United States
Xiaotian Fang
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States
Yong Zhu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States Department of Mechanical and Aerospace Engineering, North Carolina State University, Raleigh, NC, United States
Wenpei Gao
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States

Abstract

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Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1918 - 1920
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Copyright
Copyright © Microscopy Society of America 2022

References

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The electron microscopy was carried out at the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-2025064). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).Google Scholar