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STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices

Published online by Cambridge University Press:  22 July 2022

Bradley T De Gregorio*
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Evgeniya Lock
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Keith Knipling
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Hans Cho
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Copyright
Copyright © Microscopy Society of America 2022

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